Purpose: The purpose of this study is to develop the Life Prediction Model of the Door Module Rear and to propose the Test Time applied with the accelerated failure-free test method.
Methods: By analyzing field failures, the failure mode and failure mechanism were selected. The type and level of stress that causes the failure mechanism were selected. An accelerated life test was conducted, and life was analyzed based on the test results. By estimating the shape parameter, β, and the voltage constant, n, the Test Time was calculated by the No-Failure Test Method. Finally, The Acceleration Factor under high stress condition was derived using a Life Prediction Model, and the Test Time under high stress condition was derived using the Acceleration Factor.
Results: The failure mechanism for the test results and field failure were the same. Life was analyzed to estimate the parameters of the Life Distribution and Life Prediction Model.
Conclusion: The Test Time under high stress condition was calculated using the No-Failure Test Method and the Acceleration Factor, and the effect of shortening the Test Time was obtained.
Results show that the efficiency in terms of time and cost for the Durability Test of the Door Module Rear was increased.