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Title Page
한글 초록:
Abstract:
Contents
Chapter 1. Introduction 11
Chapter 2. Theoretical Background 14
2.1. Anomalous Hall Effect 14
2.2. Perpendicular Magnetic Anisotropy 15
2.3. Voltage-Controlled Magnetic Anisotropy 16
2.4. Magnetization switching induced by Spin Orbit Torque 18
2.5. Atomic Layer Deposition 19
Chapter 3. Experiment 26
3.1. Sample fabrication 26
3.2. ALD setup 27
3.3. Measurement 28
3.3.1. Anomalous Hall Resistance Measurement 28
3.3.2. Spin orbit torque induced magnetization switching 29
3.3.3. Material Analysis of gate oxide 30
Chapter 4. VCMA effect on TiO₂ gate oxide 37
4.1. Non-volatile & Time dependent property of VCMA effect on TiO₂ gate oxide 37
4.2. VCMA effect on TiO₂ gate oxide with different deposition temperature 38
4.2.1. Modulation of He and RAHE by Electric field[이미지참조] 38
4.2.2. Modulation of magnetic anisotropy field by Electric field 39
4.2.3. Modulation of SOT switching current by Electric field 41
Chapter 5. Material analysis of TiO₂ 48
5.1. X-Ray Diffraction Analysis 48
5.2. X-ray Photoelectron Spectroscopy Analysis 48
5.3. I-V Measurement 49
5.4. Relation between efficiency of VCMA effect and material properties of TiO₂ 49
Chapter 6. Conclusions 53
Bibliography 55
Curriculum Vitae 61
Figure 1.1. Comparison of device performance with memory type 13
Figure 1.2. Schematic of in-plane MTJ and perpendicular MTJ 13
Figure 2.1. A simple picture showing the origin of PMA. When the hybridization of out-of plane orbitals of ferromagnet and O 2pz orbital occurs, it leads to an uncompensated occupation in FM in-plane orbitals and results...[이미지참조] 20
Figure 2.2. Schematic of the effect of the electric field on electron filling of the 3d orbitals in the ultrathin Fe layer. Application of a negative voltage, for example, may suppress the number of electrons in the mz = 0 states...[이미지참조] 21
Figure 2.3. Calculated minority-spin band structures and MCA energy contribution, EMCA(k) along high-symmetry directions for (a) Fe/MgO and (b) Fe/FeO/MgO structures in external electric fields of -1 V/Å (dashed... 22
Figure 2.4. Magnetic Anisotropy field of Pt/Co/AlOx samples, measured by AHE, as a function of the oxidation time of Al. 22
Figure 2.5. Schematic view of gate-electrode structure. g-k Polar MOKE hysteresis loops measured at room temperature showing the device in its virgin state (g), after applying Vg=-4 V at 100 ℃ for 1 s (h), 150 s (i) and... 23
Figure 2.6. Normalized XAS spectra (a) and XMCD spectra (b) at the Co L₃ edge showing the EF-controlled oxidation state and magnetization of ultrathin Co films. The curves have been vertically shifted for clarity. 23
Figure 2.7. Two origins of spin orbit torque (a) Rashba effect, Conduction electrons in ferromagnet moving in the x direction experience an electric field along the z-direction due to structural inversion asymmetry at the interface.... 24
Figure 2.8. Schemes of full ALD process, (a) Precursor feeding process, (b) Purge process, (c) Reactant exposure process, (d) Purge process. 25
Figure 3.1. Schematic of HM/FM/Oxide structure. The device consists of HM line (Ta) and island (CoFeB/MgO/AlOx). TiO₂ gate oxide is deposited on top of island structure by ALD. 32
Figure 3.2. Chemical properties of TDMATi. 32
Figure 3.3. Optimizing ALD process with varying condition. (a) Optimization of precursor feeding process, purge time and oxidation time is fixed to 10s and 4s (t₁/10s/4s/10s). (b) Optimization of oxidation process, precursor... 33
Figure 3.4. ALD window of TDMATi, from 110 ℃ to 175 ℃, GPC shows constant value about 0.7A/s. At temperature above 200 ℃ GPC increases because of precursor decomposition. 34
Figure 3.5. Schematic of measurement technique for anomalous hall voltage. When current flows in the x-direction, the anomalous hall voltage is generated in the y-direction. 34
Figure 3.6. R-H curve of Ta(5)/CoFeB(1.2)/MgO(1.6)/AlOx(1.4)/TiO₂(35) structure with different direction of magnetic field. (a) R-H curve with magnetic field in the direction perpendicular to the film plane (easy axis). (b)... 35
Figure 3.7. Schematic of Bragg's law. When incident x-ray with wavelength of λ satisfies the Bragg's law, scattered x-rays have strong intensity due to constructive interference which is called diffraction. 35
Figure 3.8. Schematic of principle of XPS. Electrons are emitted by incident X-ray with energy of hv and its kinetic energy is KE=hv - BE - Φ. Therefore, we can extract the binding energy (BE) and analyze the chemical... 36
Figure 4.1. Anomalous hall measurement of Ta/CoFeB/MgO/AlOx/TiO₂ structure. After electric field application, AHE measurement was performed. TiO₂ is deposited at 150 ℃. (a) Non-volatile property of VCMA effect. The... 43
Figure 4.2. Anomalous hall measurement of Ta/CoFeB/MgO/AlOx/TiO₂ structure with different deposition temperature of TiO₂. (a) When negative bias is applied, all of samples showed decrease of coercivity and... 44
Figure 4.3. Changes in (a) anomalous hall resistance and (b) coercivity as a function of polarity of the electric field. 45
Figure 4.4. Changes in magnetic anisotropy field depending on the polarity of the electric field. 45
Figure 4.5. Relation between deposition temperature of TiO₂ and rate of change of magnetic anisotropy field. all four samples showed the change of magnetic anisotropy field when electric field is applied with non-volatile property 46
Figure 4.6. Changes in SOT induced switching current depending on the polarity of the electric field. 46
Figure 4.7. Relation between deposition temperature of TiO₂ and rate of change of switching current. all four samples showed the change of Jc when electric field is applied with non-volatile property[이미지참조] 47
Figure 5.1. X-Ray Diffraction of TiO₂ 35㎚ depending on the deposition temperature. 51
Figure 5.2. XPS spectra of (a) Survey, (b) O 1s, (c) Ti 2p. (d) O 1s spectra depending on the deposition temperature. (e) Relation between NLO contents and atomic ratio of O / Ti. 51
Figure 5.3. (a) I-V measurement of TiO₂ 35㎚ depending on the deposition temperature. (b) Relation between deposition temperature of TiO₂ and Leakage current. (c) Relation between Leakage current and rate of change in... 52
Figure 5.4. Plots showing the relation between NLO contents and the rate of change in (a) Anomalous hall resistance, (b) Coercivity, (c) Magnetic anisotropy field, (d) SOT switching current. 52
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